SALE $29.00 Original price was: $29.00.$17.40Current price is: $17.40. Test method for resistivity of conductive fine ceramic thin films with a four-point probe arraystandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998 JIS R 1637 quantity Add to cart Category: JIS Description JIS R 1637 – Test method for resistivity of conductive fine ceramic thin films with a four-point probe array Product Details Published: 01/01/1998 File Size: 1 file , 320 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products JIS Z 9117:1984 $50.00 Original price was: $50.00.$30.00Current price is: $30.00. Add to cart JIS Z 9358 $32.00 Original price was: $32.00.$19.20Current price is: $19.20. Add to cart JIS Z 9290-3 $290.00 Original price was: $290.00.$174.00Current price is: $174.00. Add to cart JIS Z 9117 $68.00 Original price was: $68.00.$40.80Current price is: $40.80. Add to cart
JIS R 1637 – Test method for resistivity of conductive fine ceramic thin films with a four-point probe array Product Details Published: 01/01/1998 File Size: 1 file , 320 KB Note: This product is unavailable in Russia, Ukraine, Belarus
